![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - The application of new simulated annealing genetic algorithm in film characters measurement
Chu, Dong, Ye, Shenghua, Zhang, Guangjun, Gong, Xing-zhi, Cheng, Liang, Ni, Jun, Yu, Fei-hongVolume:
7511
Year:
2009
Language:
english
DOI:
10.1117/12.837924
File:
PDF, 318 KB
english, 2009