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SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - San Diego, California, USA (Sunday 27 June 2010)] Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V - Characterizing Si x N y absorbers and support beams for far-infrared/submillimeter transition-edge sensors
Beyer, A. D., Holland, Wayne S., Zmuidzinas, Jonas, Kenyon, M. E., Echternach, P. M., Eom, B.-H., Bueno, J., Day, P. K., Bock, J. J., Bradford, C. M.Volume:
7741
Year:
2010
Language:
english
DOI:
10.1117/12.857885
File:
PDF, 2.57 MB
english, 2010