SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Absolute realization of low BRDF value
Liu, Zilong, Zhang, Yudong, Sasián, José, Liao, Ningfang, Li, Ping, Xiang, Libin, Wang, Yu, To, SandyVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.864900
File:
PDF, 500 KB
english, 2010