SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Infrared Remote Sensing and Instrumentation XIX - Characterization of narrow-band near-IR diodes arranged in array patterns
Ortega, Antonio, Strojnik, Marija, Paez, Gonzalo, Paez, Gonzalo, Strojnik, MarijaVolume:
8154
Year:
2011
Language:
english
DOI:
10.1117/12.895997
File:
PDF, 5.86 MB
english, 2011