SPIE Proceedings [SPIE 2nd European Congress on Optics Applied to Metrology - Strasbourg, France (Monday 26 November 1979)] 2nd European Congress on Optics Applied to Metrology - Interferential Wavelengths Comparison With Real-Time Signal Processing
Bouchareine, P., Rougie, B., Grosmann, Michel H., Meyrueis, PatrickVolume:
210
Year:
1980
Language:
english
DOI:
10.1117/12.958314
File:
PDF, 169 KB
english, 1980