![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE 1986 Technical Symposium Southeast - Orlando (Tuesday 1 April 1986)] Applications of Artificial Intelligence III - Auto Atic 3D Reconstruction From Serial Section Electron Micrographs
Selfridge, Peter G., Gilmore, John F.Volume:
635
Year:
1986
Language:
english
DOI:
10.1117/12.964169
File:
PDF, 9.39 MB
english, 1986