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Size Effect of Nano Scale Phase Change Random Access Memory
Son, Ji Hoon, Choi, HongKyw, Jang, Nakwon, Kim, Hong Seung, Yi, Dong Young, Lee, Seong HwanVolume:
10
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2010.2276
Date:
May, 2010
File:
PDF, 3.11 MB
english, 2010