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Impact of Drift Gap, N-Layer, and Deep N+ Sinker on Breakdown Voltage and Saturation Current of Lateral Double-Diffused Metal Oxide Semiconductor Transistor
Sung, Kunsik, Won, TaeyoungVolume:
11
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2011.4848
Date:
August, 2011
File:
PDF, 6.43 MB
english, 2011