Measuring Nanolayer Profiles of Various Materials by...

Journal of Nanoscience and Nanotechnology 2012 / 03 Vol. 12; Iss. 3

Measuring Nanolayer Profiles of Various Materials by Evanescent Light Technique

Mirchin, Nina, Apter, Boris, Lapsker, Igor, Fogel, V., Gorodetsky, Uri, Popescu, Simona A., Peled, Aaron, Popescu-Pelin, Gianina, Dorcioman, Gabriela, Duta, Liviu, Popescu, Andrei, Mihailescu, Ion N.
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Volume:
12
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2012.5788
Date:
March, 2012
File:
PDF, 457 KB
english, 2012
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