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Detection of LO and TO Phonons in Amorphous SiO2 Films by Oblique Incidence of IR Light
K. Hübner, L. Schumann, A. Lehmann, H. H. Vajen, G. ZutherVolume:
104
Year:
1981
Language:
english
Pages:
1
DOI:
10.1002/pssb.2221040145
File:
PDF, 203 KB
english, 1981