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[IEEE 2016 IEEE Applied Power Electronics Conference and Exposition (APEC) - Long Beach, CA, USA (2016.3.20-2016.3.24)] 2016 IEEE Applied Power Electronics Conference and Exposition (APEC) - Dynamic characterization of the input and reverse transfer capacitances in power MOSFETs under high current conduction
Salcines, Cristino, Kallfass, Ingmar, Kakitani, Hisao, Mikata, AtsushiYear:
2016
Language:
english
DOI:
10.1109/apec.2016.7468285
File:
PDF, 786 KB
english, 2016