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[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Debug and prediction of EOS events using long duration Transmission Line Pulse (TLP) measurements
Clarke, Dave, Heffernan, StephenYear:
2015
Language:
english
DOI:
10.1109/eosesd.2015.7314804
File:
PDF, 631 KB
english, 2015