[IEEE 2014 15th International Conference on Electronic Packaging Technology (ICEPT) - Chengdu, China (2014.8.12-2014.8.15)] 2014 15th International Conference on Electronic Packaging Technology - Nanoscale characterization of ferroelectric materials by scanning probe microscope under ultrahigh vacuum
Suzuki, Keigo, Okamoto, Takafumi, Kondo, Hiroyuki, Suzuki, Shoichiro, Hosokura, Tadasu, Murayama, Koji, Tanaka, Nobuhiko, Ando, AkiraYear:
2014
Language:
english
DOI:
10.1109/icept.2014.6918764
File:
PDF, 614 KB
english, 2014