[IEEE 2005 IEEE International Technology Management Conference (ICE) - Munich, Germany (2005.6.20-2005.6.22)] 2005 IEEE International Technology Management Conference (ICE) - Three-layered traceability system supporting both blanching and assembly process
Takeno, Takeo, Okamoto, Azuma, Horikawa, Mitsuyoshi, Uetake, Toshifumi, Sugawara, MitsumasaYear:
2005
Language:
english
DOI:
10.1109/itmc.2005.7461288
File:
PDF, 544 KB
english, 2005