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[IEEE Technical Digest of the 17th International Vacuum Nanoelectronics Conference - Cambridge, MA, USA (11-16 July 2004)] Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) - New mechanism of cluster field evaporation in rf breakdown
Insepov, Z., Norem, J.H., Hassanein, A.Year:
2004
Language:
english
DOI:
10.1109/ivnc.2004.1354961
File:
PDF, 85 KB
english, 2004