[IEEE 2016 32nd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2016.3.14-2016.3.17)] 2016 32nd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - Analytical investigation of thermal contact resistance (TCR) behavior under time-dependent thermal load
Ahmadi, Mehran, Fakoor Pakdaman, Mohammad, Bahrami, MajidYear:
2016
Language:
english
DOI:
10.1109/semi-therm.2016.7458440
File:
PDF, 917 KB
english, 2016