[IEEE 2016 32nd Thermal Measurement, Modeling &...

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[IEEE 2016 32nd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2016.3.14-2016.3.17)] 2016 32nd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) - A new approach to predict fan failures with fan speed correlation

Cong Li,, Daniel, Abishai, Ahuja, Nishi
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Year:
2016
Language:
english
DOI:
10.1109/semi-therm.2016.7458451
File:
PDF, 588 KB
english, 2016
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