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[IEEE IC's - Kitakyushu, Japan (2004.05.27-2004.05.27)] Proceedings of the 16th International Symposium on Power Semiconductor Devices & IC's - Enhanced short-circuit withstanding capability of the emitter switched thyristor (EST) by employing a new protection circuit
Byung-Chul Jeon,, In-Hwan Ji,, Soo-Seong Kim,, Seung-Chul Lee,, Yearn-Ik Choi,, Min-Koo Han,Year:
2004
Language:
english
DOI:
10.1109/wct.2004.239987
File:
PDF, 245 KB
english, 2004