![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Laser Dimensional Metrology: Recent Advances for Industrial Application - Brighton, United Kingdom (Tuesday 5 October 1993)] Laser Dimensional Metrology: Recent Advances for Industrial Application - On-line particle size and velocity measurements by the analysis of defocused images: extended depth of field
Lebrun, Denis, Ozkul, Cafer, Touil, C. E., Blaisot, J. B., Kleitz, Alain, Downs, Michael J.Volume:
2088
Year:
1993
Language:
english
DOI:
10.1117/12.168074
File:
PDF, 346 KB
english, 1993