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SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Machine Vision Applications, Architectures, and Systems Integration III - Real-time crowdedness measuring system for Taejon EXPO '93
Jung, SoonKi, Lee, Kwangho, Kim, ZuWhan, Wohn, KwangYun, Batchelor, Bruce G., Solomon, Susan S., Waltz, Frederick M.Volume:
2347
Year:
1994
Language:
english
DOI:
10.1117/12.188753
File:
PDF, 770 KB
english, 1994