SPIE Proceedings [SPIE SPIE Optical Metrology 2013 -...

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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Methods for Inspection, Characterization, and Imaging of Biomaterials - Second-harmonic interferometry with high spatial resolution: a robust method towards quantitative phase imaging of transparent dispersive materials

Brandi, F., Conti, F., Tiberi, M., Giammanco, F., Diaspro, A., Ferraro, Pietro, Ritsch-Marte, Monika, Grilli, Simonetta, Stifter, David
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Volume:
8792
Year:
2013
Language:
english
DOI:
10.1117/12.2020846
File:
PDF, 531 KB
english, 2013
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