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SPIE Proceedings [SPIE The Hague '90, 12-16 April - The Hague, Netherlands (Thursday 1 March 1990)] Optical Thin Films and Applications - Characterization of optical thin films for applications at 10.6 μm
Kaspar, Martin, Pfefferkorn, R., Ramm, Juergen, Herrmann, ReinhardVolume:
1270
Year:
1990
Language:
english
DOI:
10.1117/12.20369
File:
PDF, 475 KB
english, 1990