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SPIE Proceedings [SPIE SPIE's 1995 Symposium on Microlithography - Santa Clara, CA (Sunday 19 February 1995)] Advances in Resist Technology and Processing XII - Plasma etch characteristics of electron-beam processed photoresist

Ross, Matthew F., Comfort, D., Gorin, Georges, Allen, Robert D.
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Volume:
2438
Year:
1995
Language:
english
DOI:
10.1117/12.210401
File:
PDF, 2.16 MB
english, 1995
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