SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Multilayer and Grazing Incidence X-Ray/EUV Optics III - Iridium optical constants from x-ray transmission measurements over 2 to 12 keV
Harris, Bernard, Graessle, Dale E., Fitch, Jonathan J., Juda, Jiahong Z., Blake, Richard L., Schattenburg, Mark L., Gullikson, Eric M., Hoover, Richard B., Walker II, Arthur B. C.Volume:
2805
Year:
1996
Language:
english
DOI:
10.1117/12.245109
File:
PDF, 506 KB
english, 1996