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SPIE Proceedings [SPIE Material Science and Material Properties for Infrared Optoelectronics - Uzhgorod, Ukraine (Monday 30 September 1996)] Material Science and Material Properties for Infrared Optoelectronics - Correlation between crystal defects and properties of CdTe:Ge radiation detectors
Feichuk, P., Shcherbak, L., Pluta, D., Moravec, Pavel, Franc, Jan, Belas, Eduard, Hoschl, Pavel, Sizov, Fiodor F., Tetyorkin, Vladimir V.Volume:
3182
Year:
1997
DOI:
10.1117/12.280410
File:
PDF, 1.31 MB
1997