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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] X-Ray and Ultraviolet Spectroscopy and Polarimetry II - White-light stray light test of the SOHO UVCS
Leviton, Douglas B., Gardner, Larry D., Fineschi, Silvano, Jhabvala, Murzy D., Kohl, John L., Romoli, Marco, Noci, Giancarlo C., Fineschi, SilvanoVolume:
3443
Year:
1998
Language:
english
DOI:
10.1117/12.333613
File:
PDF, 492 KB
english, 1998