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SPIE Proceedings [SPIE Microlithography '99 - Santa Clara, CA (Sunday 14 March 1999)] Optical Microlithography XII - Verifying the "correctness" of your optical proximity correction designs
Malhotra, Vinod K., Chang, Fang C., Van den Hove, LucVolume:
3679
Year:
1999
Language:
english
DOI:
10.1117/12.354315
File:
PDF, 1.87 MB
english, 1999