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SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Optical Measurement Systems for Industrial Inspection - Miniaturization of speckle interferometry for rapid strain analysis
Wegner, Ronny, Ettemeyer, Andreas, Kujawinska, Malgorzata, Osten, WolfgangVolume:
3824
Year:
1999
Language:
english
DOI:
10.1117/12.364278
File:
PDF, 3.53 MB
english, 1999