![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Submillimeter bolt location in car bodywork for production line quality inspection
Altamirano-Robles, Leopoldo, Arias-Estrada, Miguel, Alviso-Quibrera, Samuel, Lopez-Lopez, Aurelio, Tobin, Jr., Kenneth W.Volume:
3966
Year:
2000
Language:
english
DOI:
10.1117/12.380079
File:
PDF, 2.77 MB
english, 2000