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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II - Automated inspection of tellurium inclusions in cadmium zinc telluride (CdZnTe)
Nelson, Matthew P., Ribar, Juliana M., Schweitzer, Robert, Keitzer, Scott A., Treado, Patrick J., Harris, Karl A., Reese, Danny J., James, Ralph B., Schirato, Richard C.Volume:
4141
Year:
2000
Language:
english
DOI:
10.1117/12.407581
File:
PDF, 644 KB
english, 2000