SPIE Proceedings [SPIE Symposium on Integrated Optics - San Jose, CA (Saturday 20 January 2001)] Optoelectronic Integrated Circuits and Packaging V - Generalized spectral index approach for the analysis of 3D structures
Greedy, Stephen C., Sewell, Phillip, Benson, Trevor M., Grote, James G., Heyler, Randy A.Volume:
4290
Year:
2001
Language:
english
DOI:
10.1117/12.426904
File:
PDF, 102 KB
english, 2001