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SPIE Proceedings [SPIE Lightmetry - Pultusk, Poland (Monday 5 June 2000)] Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light - AFM and optical methods in determining roughness of SERS-active silver electrodes
Kruszewski, Stefan, Kobiela, T., Pluta, MaksymilianVolume:
4517
Year:
2001
Language:
english
DOI:
10.1117/12.435960
File:
PDF, 398 KB
english, 2001