SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise in Devices and Circuits - Accurate modeling of noise parameters in subquarter-micrometer gate FETs using physical simulators
Abou-Elnour, Ali, Deen, M. Jamal, Celik-Butler, Zeynep, Levinshtein, Michael E.Volume:
5113
Year:
2003
Language:
english
DOI:
10.1117/12.497029
File:
PDF, 919 KB
english, 2003