SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Combustion diagnostics by quantitative two-photon polarization spectroscopy of atomic hydrogen

Steiger, Andreas, de la Rosa, M. I., Gruetzmacher, Klaus, Gonzalo, Ana B., Steiger, Martina, Osten, Wolfgang, Kujawinska, Malgorzata, Creath, Katherine
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Volume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.500070
File:
PDF, 100 KB
english, 2003
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