SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Recent Developments in Traceable Dimensional Measurements II - Static calibrations of LVDT sensors for traceable gauge blocks
Tang, Chung-chi, Cheng, Kai-Yu, Huang, Huang-Chi, Decker, Jennifer E., Brown, NicholasVolume:
5190
Year:
2003
Language:
english
DOI:
10.1117/12.505286
File:
PDF, 131 KB
english, 2003