![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Optical Fabrication, Testing, and Metrology - Aberration analysis and adjustment of nonspherical lens in the linear CCDs three-dimensional measurement system
Wu, Jian, Ding, Haishu, Wang, Guangzhi, Geyl, Roland, Rimmer, David, Wang, LingliVolume:
5252
Year:
2004
Language:
english
DOI:
10.1117/12.508461
File:
PDF, 174 KB
english, 2004