SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Optical Design and Testing II - Analysis of alignment error in asphere testing using a corrector
Xue, Donglin, Zheng, Ligong, Zhang, Xuejun, Wang, Yongtian, Weng, Zhicheng, Ye, Shenghua, Sasian, Jose M.Volume:
5638
Year:
2005
Language:
english
DOI:
10.1117/12.574991
File:
PDF, 131 KB
english, 2005