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SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Electronic speckle pattern interferometry applied to the displacement measurement of sandwich plates with double fully potted inserts
Huang, Song-Jeng, Lin, Hwa-Long, Lopez, Jose F., Quan, Chenggen, Chau, Fook Siong, Fernandez, Francisco V., Lopez-Villegas, Jose Maria, Asundi, Anand, Wong, Brian Stephen, de la Rosa, Jose M., Lim, ChYear:
2012
Language:
english
DOI:
10.1117/12.621535
File:
PDF, 566 KB
english, 2012