SPIE Proceedings [SPIE Fifth Symposium - Santiago De Queretaro, Mexico (Thursday 8 September 2005)] Fifth Symposium Optics in Industry - Estimation of corrosion parameters in electrochemical systems using Michelson interferometry
Mayorga-Cruz, D., Uruchurtu-Chavarín, J., Sarmiento-Martínez, O., Márquez-Aguilar, P. A., Castrellón-Uribe, J., Rosas, Eric, Cardoso, Rocío, Bermudez, Juan C., Barbosa-García, OracioVolume:
6046
Year:
2006
Language:
english
DOI:
10.1117/12.674445
File:
PDF, 336 KB
english, 2006