SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Compensation and test of reflective mirror
Hao, Peiming, Hou, Xun, Yuan, Jiahu, Fu, Lianxiao, Yuan, Liyin, Wyant, James C., Wang, Hexin, Li, Weiwei, Pan, Baozhu, Han, SenVolume:
6150
Year:
2005
Language:
english
DOI:
10.1117/12.676410
File:
PDF, 227 KB
english, 2005