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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Innovation application of area array CCD based on CPLD
Wang, Riming, Hou, Xun, Yuan, Jiahu, Xu, Du, Jiang, Yongping, Wyant, James C., Wang, Hexin, Xie, Zhikai, Han, SenVolume:
6150
Year:
2005
Language:
english
DOI:
10.1117/12.676650
File:
PDF, 357 KB
english, 2005