SPIE Proceedings [SPIE SPIE Optics + Photonics - San Diego, California, USA (Sunday 13 August 2006)] Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II - No such thing as σ: flowdown and measurement of surface roughness requirements
Uy, O. Manuel, Dittman, Michael G., Grochocki, Frank, Straka, Sharon A., Fleming, John C., Youngworth, Kathleen, Dittman, Michael G.Volume:
6291
Year:
2006
Language:
english
DOI:
10.1117/12.678314
File:
PDF, 200 KB
english, 2006