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SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Life testing of electronic components: a Bayesian approach
Voiculescu, Sorin, Guérin, Fabrice, Bacivarov, Ioan C., Iancu, Ovidiu, Manea, Adrian, Schiopu, PaulYear:
2012
Language:
english
DOI:
10.1117/12.742113
File:
PDF, 379 KB
english, 2012