SPIE Proceedings [SPIE 27th Annual BACUS Symposium on...

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SPIE Proceedings [SPIE 27th Annual BACUS Symposium on Photomask Technology - Monterey, CA (Monday 17 September 2007)] Photomask Technology 2007 - Study of impacts of mask structure on hole pattern in EUVL

Iriki, Nobuyuki, Naber, Robert J., Kawahira, Hiroichi, Arisawa, Yukiyasu, Aoyama, Hajime, Tanaka, Toshihiko
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Volume:
6730
Year:
2007
Language:
english
DOI:
10.1117/12.746592
File:
PDF, 1.50 MB
english, 2007
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