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SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Measurement of diameters of ultrafine particles based on characteristics of fluctuation of scattered light
Shen, Jin, Pan, Junhua, Wyant, James C., Yang, Shulian, Ding, Qang, Wang, Hexin, Cheng, YantingVolume:
6723
Year:
2007
Language:
english
DOI:
10.1117/12.782888
File:
PDF, 85 KB
english, 2007