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SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Analysis for dynamics decoupling of photoelectric tracking system with collimated axis eccentricity
Xu, Zhengfeng, Yang, Li, Chen, Yaolong, Chen, Jinling, Chen, Hongbin, Kley, Ernst-Bernhard, Li, Rongbin, Tang, TaoVolume:
6722
Year:
2007
Language:
english
DOI:
10.1117/12.783008
File:
PDF, 266 KB
english, 2007