SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Remote measurements system for applications in photonic materials characterization
Lesiak, P., Ertman, S., Budaszewski, D., Domański, A. W., Woliński, T. R., Burska, I., Klimczak, M., Piramidowicz, R., Warda, P., Kamiński, W., Sitnik, R., Kujawińska, M., Dorosz, Jan, Romaniuk, RyszaYear:
2012
Language:
english
DOI:
10.1117/12.804533
File:
PDF, 1.10 MB
english, 2012