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SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII - The concept of a new simple low-voltage cathodoluminescence set-up with CNT field emission cathodes
Psuja, Piotr, Kullberg, Richard C., Ramesham, Rajeshuni, Hreniak, Dariusz, Strek, WieslawVolume:
7206
Year:
2009
Language:
english
DOI:
10.1117/12.808963
File:
PDF, 1.30 MB
english, 2009