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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Image denoising method based on 3D transform and local noise analysis
Li, ZhiHui, Yoshizawa, Toru, Wei, Ping, Xu, XiaoJing, Liu, HaiZhen, Zheng, Jesse, Wang, YongQiangVolume:
7513
Year:
2009
Language:
english
DOI:
10.1117/12.838016
File:
PDF, 2.88 MB
english, 2009