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SPIE Proceedings [SPIE BiOS - San Francisco, California (Saturday 23 January 2010)] Ophthalmic Technologies XX - Measurement of the tear film and anterior chamber by confocal microscopy
Buttenschön, Kim K., Manns, Fabrice, Söderberg, Per G., Girkin, John M., Wilson, Clive G., Ho, Arthur, Daly, Daniel J.Volume:
7550
Year:
2010
Language:
english
DOI:
10.1117/12.842187
File:
PDF, 353 KB
english, 2010